Jeep task force RCA - "Mi okozhat zárlatos battery FET-et?" by Alberto Catani https://padlet.com/alberto_catani/3osp1g9i23q3mykm copy the posts from the mind map padlet in the column corresponding to your team number! en-us 2025-05-16 06:07:40 UTC 2025-05-21 10:58:41 UTC hello@padlet.com Onsemi Supplier Management https://padlet.com/alberto_catani/3osp1g9i23q3mykm/wish/3458939391 Onsemi wafer (silicone) variations;

]]> 2025-05-20 08:07:28 UTC https://padlet.com/alberto_catani/3osp1g9i23q3mykm/wish/3458939391 ESD https://padlet.com/alberto_catani/3osp1g9i23q3mykm/wish/3458940360 2025-05-20 08:08:09 UTC https://padlet.com/alberto_catani/3osp1g9i23q3mykm/wish/3458940360 cross-shutdown https://padlet.com/alberto_catani/3osp1g9i23q3mykm/wish/3458940927 pre-damage the component

]]> 2025-05-20 08:08:38 UTC https://padlet.com/alberto_catani/3osp1g9i23q3mykm/wish/3458940927 Onsemi FAB Processes https://padlet.com/alberto_catani/3osp1g9i23q3mykm/wish/3458941233 Source contact depth control

]]> 2025-05-20 08:08:53 UTC https://padlet.com/alberto_catani/3osp1g9i23q3mykm/wish/3458941233 Onsemi FAB Processes https://padlet.com/alberto_catani/3osp1g9i23q3mykm/wish/3458942132 Gate trench impurities

]]> 2025-05-20 08:09:44 UTC https://padlet.com/alberto_catani/3osp1g9i23q3mykm/wish/3458942132 Onsemi FAB Processes https://padlet.com/alberto_catani/3osp1g9i23q3mykm/wish/3458942750 Trench misalignment

]]> 2025-05-20 08:10:18 UTC https://padlet.com/alberto_catani/3osp1g9i23q3mykm/wish/3458942750 Onsemi FAB Processes https://padlet.com/alberto_catani/3osp1g9i23q3mykm/wish/3458943700 Source contact width

]]> 2025-05-20 08:11:07 UTC https://padlet.com/alberto_catani/3osp1g9i23q3mykm/wish/3458943700 https://padlet.com/alberto_catani/3osp1g9i23q3mykm/wish/3458944177 A Reverse és a Battery FET-es külön kezelni. Reverse FET esetlén mechanika hiba?


]]> 2025-05-20 08:11:31 UTC https://padlet.com/alberto_catani/3osp1g9i23q3mykm/wish/3458944177 Onsemi FAB Processes https://padlet.com/alberto_catani/3osp1g9i23q3mykm/wish/3458944918 Doping process

]]> 2025-05-20 08:12:03 UTC https://padlet.com/alberto_catani/3osp1g9i23q3mykm/wish/3458944918 Onsemi FAB Processes https://padlet.com/alberto_catani/3osp1g9i23q3mykm/wish/3458945695 sample based probe test (not 100%)

]]> 2025-05-20 08:12:35 UTC https://padlet.com/alberto_catani/3osp1g9i23q3mykm/wish/3458945695 Application/Vehicle environment https://padlet.com/alberto_catani/3osp1g9i23q3mykm/wish/3458946302

  • Vehicle network and other ECUs behave in a way that is harmful to our ECU

  • The test vehicle we use is not representative/production intent

  • The vehicle SW is not up-to-date (including the SW of other ECUs involved)

  • Charging the vehicle 12 V battery

    • High frequency ripple 1kHz, caused by battery charger

    • DC/DC converter interaction with EPS

  • Charging the 400 V battery

    • High amplitude voltage fluctuations with high dV/dt

    • High freq EM fields

  • A and B sides are always connected? Ground shift?



    • ]]>     2025-05-20 08:13:05 UTC https://padlet.com/alberto_catani/3osp1g9i23q3mykm/wish/3458946302     Onsemi FAB Processes https://padlet.com/alberto_catani/3osp1g9i23q3mykm/wish/3458946387 sample based AOI inspection (KLA, not 100%)

    ]]>     2025-05-20 08:13:09 UTC https://padlet.com/alberto_catani/3osp1g9i23q3mykm/wish/3458946387     Onsemi supplier management https://padlet.com/alberto_catani/3osp1g9i23q3mykm/wish/3458948140 Wafer vendor validation

    ]]>     2025-05-20 08:14:24 UTC https://padlet.com/alberto_catani/3osp1g9i23q3mykm/wish/3458948140     Charging algorithm https://padlet.com/alberto_catani/3osp1g9i23q3mykm/wish/3458948351

  • DC link cap charging causes unstented stress

  • Maybe a small fraction of the FETs die is doing the heavy lifting, causing thermal overstress, degradation of the oxide layer

    • ]]>     2025-05-20 08:14:31 UTC https://padlet.com/alberto_catani/3osp1g9i23q3mykm/wish/3458948351     FET design https://padlet.com/alberto_catani/3osp1g9i23q3mykm/wish/3458949718 A FET kialakítása miatt nem képes a lavina áramok elviselésére.

    Ez a FET illik-e abba a működési környezetbe, ahol használjuk.

    ]]>     2025-05-20 08:15:33 UTC https://padlet.com/alberto_catani/3osp1g9i23q3mykm/wish/3458949718     Weak FET LOT https://padlet.com/alberto_catani/3osp1g9i23q3mykm/wish/3458949843 Valamelyik gyártástechnológiai lépés során elszenvedett hatás miatt nem képes a lavina áramok elviselésére.

    ]]>     2025-05-20 08:15:36 UTC https://padlet.com/alberto_catani/3osp1g9i23q3mykm/wish/3458949843     Onsemi FAB Processes https://padlet.com/alberto_catani/3osp1g9i23q3mykm/wish/3458950815 Only 3 mm exclusion from wafer edge

    ]]>     2025-05-20 08:16:14 UTC https://padlet.com/alberto_catani/3osp1g9i23q3mykm/wish/3458950815     Onsemi internal Lessons Learned https://padlet.com/alberto_catani/3osp1g9i23q3mykm/wish/3458952419 No effective knowlegde transfer from Aizu to EFK

    ]]>     2025-05-20 08:17:22 UTC https://padlet.com/alberto_catani/3osp1g9i23q3mykm/wish/3458952419     Onsemi Back End / Assembly https://padlet.com/alberto_catani/3osp1g9i23q3mykm/wish/3458953567 Potentially high allowed solder void ratio

    ]]>     2025-05-20 08:18:16 UTC https://padlet.com/alberto_catani/3osp1g9i23q3mykm/wish/3458953567     Onsemi FAB processes https://padlet.com/alberto_catani/3osp1g9i23q3mykm/wish/3458965054 Particle

    ]]>     2025-05-20 08:26:15 UTC https://padlet.com/alberto_catani/3osp1g9i23q3mykm/wish/3458965054     https://padlet.com/alberto_catani/3osp1g9i23q3mykm/wish/3458984656 5C vs CCC összehasolítása


    ]]>     2025-05-20 08:39:09 UTC https://padlet.com/alberto_catani/3osp1g9i23q3mykm/wish/3458984656     TKP component specific requirement https://padlet.com/alberto_catani/3osp1g9i23q3mykm/wish/3459022862 5C működési tartománya - kondíciók meg voltak erősítve ONSEMI által ?


    • repetitive avalanche? ( a datasheet jellemzően single avalanche-ra vonatkozik)

    • design review?


    ]]>     2025-05-20 09:06:58 UTC https://padlet.com/alberto_catani/3osp1g9i23q3mykm/wish/3459022862     Onsemi FAB processess https://padlet.com/alberto_catani/3osp1g9i23q3mykm/wish/3459029443 Masking failure - due to recognized pattern of failure locations

    ]]>     2025-05-20 09:12:27 UTC https://padlet.com/alberto_catani/3osp1g9i23q3mykm/wish/3459029443     Onsemi FAB Processes https://padlet.com/alberto_catani/3osp1g9i23q3mykm/wish/3459037144 Not 100% DPAT at probe test (10% smart sample) --> DPAT is to identify and exclude outliers

    ]]>     2025-05-20 09:18:04 UTC https://padlet.com/alberto_catani/3osp1g9i23q3mykm/wish/3459037144     ONSEMI design limitation https://padlet.com/alberto_catani/3osp1g9i23q3mykm/wish/3459041548 Structural (physical) limitation of trench MOSFET design


    • ONSEMI simulation of the trenches with basic smaller mosfets had the same failure position

    ]]>     2025-05-20 09:21:52 UTC https://padlet.com/alberto_catani/3osp1g9i23q3mykm/wish/3459041548