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Thank you to all our customers who have made 20 years in business possible. Our pledge back then, as it is today, is to provide outstanding service. Further, SEMTech Solutions remains dedicated to preserving, extending and enhancing the operational lifetime of scanning electron microscopes worldwide.

We look forward to serving you well into the future and will continually strive to meet the demanding requirements necessary to ensure our mutual success.

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SEMTech Solutions Celebrates 20 Years - Semtechsolutions

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Thank you to all our customers who have made 20 years in business possible. Our pledge back then, as it is today, is to provide outstanding service. Further, SEMTech Solutions remains dedicated to preserving, extending and enhancing the operational lifetime of scanning electron microscopes worldwide.

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SEMTech Solutions will be attending the Microscopy and Microanalysis Meeting in Milwaukee, Wisconsin from August 2-6. On Display in Booth 736 will be the SEMView8000 Universal Operator Console, attached to a refurbished SEM. Additional accessories on display will be our IR Chamberscope, SDD & BSE detector. Live demonstrations of the SEMView8000 running on a Win10 platform will be available at all times.

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See Us at M&M 2020 in Milwaukee - Semtechsolutions

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SEMTech Solutions will be attending the Microscopy and Microanalysis Meeting in Milwaukee, Wisconsin from August 2-6. On Display in Booth 736 will be the SEMView8000 Universal Operator Console, attached to a refurbished SEM. Additional accessories on display will be our IR Chamberscope, SDD & BSE detector.

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SEMView8000 is a hardware and Win10 compatible software system that replaces most Original Equipment (SEM) Manufacturer's electronic consoles. The system will update most Scanning Electron Microscopes with a Personal Computer and associated Frame Grabber that can provide up to 8k x 8k digital images. The software user interface comes complete with measurement and image processing functions. An added software option is ShareView, which allows screen sharing of the SEM's monitor over the internet in real time for team project collaboration. The electronics rack contains a Universal SEM Electronics Card and numerous low noise linear power supplies. These control features such as:

Acceleration Voltage

Gun Bias

Filament Current, etc.

For more information, download the SEMView8000 presentation (PDF).

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SEMView8000 is a hardware and Win10 compatible software system that replaces most Original Equipment (SEM) Manufacturer's electronic consoles. The system will update most Scanning Electron Microscopes with a Personal Computer and associated Frame Grabber that can provide up to 8k x 8k digital images. The software user interface comes complete with measurement and image processing functions.

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The STS Silicon Drift Detector is designed to be compatible with all commercially available SEM systems and effortlessly interface with standard pulse processing electronics. The STS SD EDS detector can also be configured as a Si(Li) replacement on most end-user installed EDS systems.

SEMTech Solutions provides the following support for our customers:

Manufacture of chamber flange

SDD Detector factory installed and tested prior to shipment

1st Line of Service Support

IXRF Software installed and tested on the SEM Imaging PC - One PC Solution

The STS SD Detector provide exceptional and stable performance over a wide range of count rates (up to >1Mcps input rate).

The detector output is fully adaptable to provide optimized input directly to most analogue or digital pulse processing systems. The STS SD silicon drift detector operates with a single power supply unit and can be supplied with or without a digital pulse processor. Our STS SD system is vibration free and supplied with vacuum interface for any commercially available SEM.

The STS SD Silicon Drift Detector provides

Industry standard signal output

Compatible with most existing pulse processing systems

Reliable peltier cooled design

Low noise, excellent resolution, high rate capability

Single and multi-sensor products

Electron trap standard on sensors (SEM)

Optional translation stages / manual slides

Various collimation option

Available in standard or compact models

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SEMTech Solutions Now Offers Silicon Drift Detectors (SDD) For EDS Analysis - Semtechsolutions

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The STS Silicon Drift Detector is designed to be compatible with all commercially available SEM systems and effortlessly interface with standard pulse processing electronics.

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If you are looking for a refurbished scanning electron microscope, or to upgrade your existing SEM with Win10 SEM user interface software, the SEMView8000 universal operator control console will meet your requirements. The SEMView8000 is the power source that will drive your SEM column with a new SEM PC control board and related power electronics, as well as an 8k x 8k (64 MegaPixel) imaging frame grabber.

The SEMView8000 (pdf flyer) can transform SEMs from the major original equipment manufacturers (OEMs), such as AMRAY, FEI/Philips, Hitachi, JEOL, Zeiss/LEO and others. If you are comfortable with your existing SEM column and accessories, there is no need to purchase a completely new system. We offer a platform that extends your initial investment with improved technology, reliability, and the security your IT department requires for networking.

Our existing Win10 SEM inventory is complete with tungsten (W), lanthanum hexaboride (LaB6), and field emission (FE) scanning electron microscope columns. In addition, if you require a new SEM accessory, we tightly integrate our accessories EDS, BSE, IR Chamberscope with the SEMView8000 software.

Whether in-house or in the field, our team of highly trained service engineers are capable of installations on any SEM and provide training as well.

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Your SEM Column Upgraded To Win10 - With SEMView8000 - Semtechsolutions

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If you are looking for a refurbished scanning electron microscope, or to upgrade your existing SEM with Win10 SEM user interface software, the SEMView8000 universal operator control console will meet your requirements. The SEMView8000 is the power source that will drive your SEM column with a new SEM PC control board and related power electronics, as well as an 8k x 8k (64 MegaPixel) imaging frame grabber.

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A comparison between two backscattered electron (BSE) detectors was performed at a customer site using an AMRAY 3200-S scanning electron microscope (SEM) employing a LaB6 cathode. The two BSE detectors were a legacy BSE detector system and the SEMTech Solutions F1 BSE detector. Several metallographic cross sections were examined; a surface mount component, and a gold ball bond on top of a gallium nitride light emitting diode. Comparisons between detectors involved low kV BSE imaging, high magnification BSE imaging, and atomic number contrasting vs. topographic imaging.

Customer comments regarding the SEMTech Solutions F1 BSE detector on the electronic components evaluated were:

The SEMTech Solutions F1 BSE detector provides an unshadowed and greater resolution presentation of the intermetallic compounds and microstructure.

One of the most exciting improvements provided by the SEMTech Solutions F1 BSE detector was at high magnifications.

Many of the SEMTech Solutions F1 BSE detector images were collected at a faster albeit worse SS2 buffering rate, as compared to a SS3 scan rate for the legacy BSE detector. Despite this handicap, and being at half the pixel resolution of the legacy detector images, the F1 BSE images had less noise.

Due to its greater sensitivity, the SEMTech Solutions F1 BSE detector could be operated at lower accelerating voltages and provided a brighter, higher resolution image than the legacy BSE system.

Compared to our legacy BSE detector, the new SEMTech F1 BSE detector provided significantly better backscattered electron images.

All in all, I think the user-friendly SEMTech Solutions F1 BSE detector was a sound purchase that will benefit us for years to come.

For a more comprehensive understanding of the BSE detector evaluation, download the 5 page (8 image) PDF.

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Customer Review Of The F1 BSE Detector - Semtechsolutions

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A comparison between two backscattered electron (BSE) detectors was performed at a customer site using an AMRAY 3200-S scanning electron microscope (SEM) employing a LaB6 cathode. The two BSE detectors were a legacy BSE detector system and the SEMTech Solutions F1 BSE detector .